Nano Technology and Graphene Research Centre
PUSAT RISET PENGEMBANGAN INSTITUSI NANO TEKNOLOGI DAN GRAPHENE

Instrumentations and Imaging Technologies at Nano Scale


A. Nano Measurement: Particles Size Analyzer and Zeta Potential Measurement System

● Zeta Potential

Particles size analyzer is an important measurement system in dispersion of nano materials and the zeta measurement to understandthe dispersion stability of Nano materials suspension.


Scheme of Zeta Potential system
 
 

● Particle Size Analyzer (PSA)

PSA for high concentration using ultrasonic as a source of excitation signal in the measurement system.


PSA Instrumentation
 

B. Luminesence Equipment and Quantum Efficiency Measurement Using Integrating Sphere

● Integrating Sphere and External Quantum Efficiency (EQE)

Integrating sphere (IS) is an accurate measurement tool to obtain the lumen of light sources, i.e. LEDs.


            Scheme of Integrating Sphere
 
 

Light emitting materials are characterized by their fluorescence quantum yield. For emitting devices like organic and inorganic LEDs the respective physical value is the external quantum efficiency, measured usually by electroluminescence. For measuring EQE of a light emitting device, it is placed inside an integrating sphere and excited by constant current.


Commission de l’Eclairage (CIE) Chromaticity Diagram

C. Nano Imaging and Spectroscopy

● Atomic Force Microscopy (AFM)

Atomic force microscopy (AFM) is important tool to use as a custom-built instrumentation for detecting displacements at the nanometer level for particular purposes. It is attempted to emulate natural ways of functioning on the nano scale. Most exciting developments will come from the science behind the surface morphology related characteristics and properties of nanoscale materials.

Scheme of AFM
 
Reserachers:
Prof. Dr. Eng. I Made Joni, M.Sc.
Prof. Dr. Eng. Camellia Panatarani, M.Si
Email: imadejoni@phys.unpad.ac.id

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